root@freenas:~ # smartctl -a /dev/da1 smartctl 7.0 2018-12-30 r4883 [FreeBSD 11.3-RELEASE-p14 amd64] (local build) Copyright (C) 2002-18, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Toshiba P300 (CMR) Device Model: TOSHIBA HDWD130 Serial Number: 89DE4KWCS LU WWN Device Id: 5 000039 fe6f04084 Firmware Version: MX6OACF0 User Capacity: 3,000,592,982,016 bytes [3.00 TB] Sector Sizes: 512 bytes logical, 4096 bytes physical Rotation Rate: 7200 rpm Form Factor: 3.5 inches Device is: In smartctl database [for details use: -P show] ATA Version is: ATA8-ACS T13/1699-D revision 4 SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Tue Nov 12 20:19:42 2024 CET SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART Status command failed: Input/output error SMART overall-health self-assessment test result: PASSED Warning: This result is based on an Attribute check. General SMART Values: Offline data collection status: (0x84) Offline data collection activity was suspended by an interrupting command from host. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: (21648) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 361) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000b 100 100 016 Pre-fail Always - 0 2 Throughput_Performance 0x0005 140 140 054 Pre-fail Offline - 68 3 Spin_Up_Time 0x0007 131 131 024 Pre-fail Always - 438 (Average 437) 4 Start_Stop_Count 0x0012 100 100 000 Old_age Always - 46 5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0 7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0 8 Seek_Time_Performance 0x0005 124 124 020 Pre-fail Offline - 33 9 Power_On_Hours 0x0012 094 094 000 Old_age Always - 42848 10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 44 192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 198 193 Load_Cycle_Count 0x0012 100 100 000 Old_age Always - 198 194 Temperature_Celsius 0x0002 222 222 000 Old_age Always - 27 (Min/Max 17/43) 196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0 197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 0 SMART Error Log Version: 1 No Errors Logged SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.