I just started making my NAS as it seems one of HDDs is failing. What to do?

β€œExplain those commands.”

AI: β€œSure! :smiley: The command rm -rf ${DB_DATA_LOCATION}/* will remove the current Immich database, which will be recreated automatically after we start a new instance. This is needed to ensure no corruption exists in the current database. rm is the remove command to delete files and folders. -rf forces it to run, bypassing any permission issues. ${DB_DATA_LOCATION} is the variable that points to your current Immich database location. /* tells it to delete everything inside that folder.”

β€œThank you for letting me know!”

AI: β€œYou’re welcome!” :blush:

β€œI lost everything. All my precious memories are gone!”

3 Likes

a minor, technical correction: page 11, When evaluating SMART data.

There you have β€œExample: ID195/Hardware ECC Recovered – VALUE=200, WORST=200, THRESH=0” and then β€œIn this case, if VALUE=45 and WORST=(45 or less)”

The following paragraph is correct

Yes, I plan to stop all Docker containers before running it this night. Meanwhile, I copied (via rsync) and checked (via diff -rq) about 2Tb of data today w/o issues

True, it can happen. Happily, I keep all my essential data on my old NAS as well. Which can die during the next transfer, but I hope not :slight_smile:

In general, I fully support your main premise β€œdo not trust AI with anything important”

1 Like

An update. I ran scub and its results were: Last Scan Errors: 0

Then I ran long SMART on all my disks. All disks but the suspected (sda) finished their tests flawlessly. The suspected HDD gave the following error: sda (WD-xx) failed a SMART selftest.

However, re-running the test was ok. Here follows smartctl -x /dev/sda for the suspect disk:

smartctl 7.4 2023-08-01 r5530 [x86_64-linux-6.12.99-production+truenas] (local build)
Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org

=== START OF INFORMATION SECTION ===
Device Model:     WDC WD60EFPX-68C5ZN0
Serial Number:    WD-xx
LU WWN Device Id: 5 0014ee 2c1dc63ae
Firmware Version: 81.00A81
User Capacity:    6,001,175,126,016 bytes [6.00 TB]
Sector Sizes:     512 bytes logical, 4096 bytes physical
Rotation Rate:    5400 rpm
Form Factor:      3.5 inches
Device is:        Not in smartctl database 7.3/5528
ATA Version is:   ACS-3 T13/2161-D revision 5
SATA Version is:  SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is:    Wed Aug 26 19:08:22 2026 EEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is:   Unavailable
APM feature is:   Unavailable
Rd look-ahead is: Enabled
Write cache is:   Enabled
DSN feature is:   Unavailable
ATA Security is:  Disabled, NOT FROZEN [SEC1]
Wt Cache Reorder: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status:      (   0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection:                (61020) seconds.
Offline data collection
capabilities:                    (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities:            (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability:        (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time:        (   2) minutes.
Extended self-test routine
recommended polling time:        ( 633) minutes.
Conveyance self-test routine
recommended polling time:        (   5) minutes.
SCT capabilities:              (0x3039) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAGS    VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate     POSR-K   200   200   051    -    0
3 Spin_Up_Time            POS–K   230   225   021    -    3466
4 Start_Stop_Count        -O–CK   100   100   000    -    9
5 Reallocated_Sector_Ct   PO–CK   200   200   140    -    0
7 Seek_Error_Rate         -OSR-K   200   200   000    -    0
9 Power_On_Hours          -O–CK   100   100   000    -    365
10 Spin_Retry_Count        -O–CK   100   253   000    -    0
11 Calibration_Retry_Count -O–CK   100   253   000    -    0
12 Power_Cycle_Count       -O–CK   100   100   000    -    5
192 Power-Off_Retract_Count -O–CK   200   200   000    -    0
193 Load_Cycle_Count        -O–CK   200   200   000    -    333
194 Temperature_Celsius     -Oβ€”K   111   108   000    -    39
196 Reallocated_Event_Count -O–CK   200   200   000    -    0
197 Current_Pending_Sector  -O–CK   200   200   000    -    0
198 Offline_Uncorrectable   ----CK   100   253   000    -    0
199 UDMA_CRC_Error_Count    -O–CK   200   200   000    -    0
200 Multi_Zone_Error_Rate   β€”R--   200   200   000    -    4
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning

General Purpose Log Directory Version 1
SMART           Log Directory Version 1 [multi-sector log support]
Address    Access  R/W   Size  Description
0x00       GPL,SL  R/O      1  Log Directory
0x01           SL  R/O      1  Summary SMART error log
0x02           SL  R/O      5  Comprehensive SMART error log
0x03       GPL     R/O      6  Ext. Comprehensive SMART error log
0x04       GPL     R/O    256  Device Statistics log
0x04       SL      R/O    255  Device Statistics log
0x06           SL  R/O      1  SMART self-test log
0x07       GPL     R/O      1  Extended self-test log
0x09           SL  R/W      1  Selective self-test log
0x0c       GPL     R/O   2048  Pending Defects log
0x10       GPL     R/O      1  NCQ Command Error log
0x11       GPL     R/O      1  SATA Phy Event Counters log
0x24       GPL     R/O    307  Current Device Internal Status Data log
0x30       GPL,SL  R/O      9  IDENTIFY DEVICE data log
0x80-0x9f  GPL,SL  R/W     16  Host vendor specific log
0xa0-0xa7  GPL,SL  VS      16  Device vendor specific log
0xa8-0xb6  GPL,SL  VS       1  Device vendor specific log
0xb7       GPL,SL  VS      78  Device vendor specific log
0xbd       GPL,SL  VS       1  Device vendor specific log
0xc0       GPL,SL  VS       1  Device vendor specific log
0xc1       GPL     VS      93  Device vendor specific log
0xe0       GPL,SL  R/W      1  SCT Command/Status
0xe1       GPL,SL  R/W      1  SCT Data Transfer

SMART Extended Comprehensive Error Log Version: 1 (6 sectors)
Device Error Count: 6
CR     = Command Register
FEATR  = Features Register
COUNT  = Count (was: Sector Count) Register
LBA_48 = Upper bytes of LBA High/Mid/Low Registers ]  ATA-8
LH     = LBA High (was: Cylinder High) Register    ]   LBA
LM     = LBA Mid (was: Cylinder Low) Register      ] Register
LL     = LBA Low (was: Sector Number) Register     ]
DV     = Device (was: Device/Head) Register
DC     = Device Control Register
ER     = Error register
ST     = Status register
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It β€œwraps” after 49.710 days.

Error 6 [5] occurred at disk power-on lifetime: 315 hours (13 days + 3 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER – ST COUNT  LBA_48  LH LM LL DV DC
– – – == – == == == – – – – –
40 – 51 00 00 00 00 f8 fc ce 20 40 00  Error: WP at LBA = 0xf8fcce20 = 4177317408

Commands leading to the command that caused the error were:
CR FEATR COUNT  LBA_48  LH LM LL DV DC  Powered_Up_Time  Command/Feature_Name
– == – == – == == == – – – – –  ---------------  --------------------
61 07 e8 00 78 00 02 3b f6 c5 b0 40 08     20:33:33.732  WRITE FPDMA QUEUED
61 07 e8 00 c0 00 02 3b f6 bd c8 40 08     20:33:33.732  WRITE FPDMA QUEUED
61 07 e8 00 68 00 02 3b f6 b5 e0 40 08     20:33:33.727  WRITE FPDMA QUEUED
61 07 e8 00 60 00 02 3b f6 ad f8 40 08     20:33:33.726  WRITE FPDMA QUEUED
61 01 08 00 58 00 02 3b f6 ac 98 40 08     20:33:33.725  WRITE FPDMA QUEUED

Error 5 [4] occurred at disk power-on lifetime: 315 hours (13 days + 3 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER – ST COUNT  LBA_48  LH LM LL DV DC
– – – == – == == == – – – – –
40 – 51 00 00 00 00 f8 fc bf 60 40 00  Error: WP at LBA = 0xf8fcbf60 = 4177313632

Commands leading to the command that caused the error were:
CR FEATR COUNT  LBA_48  LH LM LL DV DC  Powered_Up_Time  Command/Feature_Name
– == – == – == == == – – – – –  ---------------  --------------------
61 00 08 00 d0 00 02 3b f6 ac 18 40 08     20:33:28.616  WRITE FPDMA QUEUED
61 00 20 00 98 00 01 8e 18 9e f0 40 08     20:33:28.616  WRITE FPDMA QUEUED
61 00 20 00 60 00 01 8d 19 db 18 40 08     20:33:28.616  WRITE FPDMA QUEUED
61 00 08 00 78 00 02 44 00 54 50 40 08     20:33:28.616  WRITE FPDMA QUEUED
61 00 18 00 90 00 02 44 00 54 30 40 08     20:33:28.616  WRITE FPDMA QUEUED

Error 4 [3] occurred at disk power-on lifetime: 307 hours (12 days + 19 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER – ST COUNT  LBA_48  LH LM LL DV DC
– – – == – == == == – – – – –
40 – 51 00 00 00 00 f8 97 d4 08 40 00  Error: WP at LBA = 0xf897d408 = 4170699784

Commands leading to the command that caused the error were:
CR FEATR COUNT  LBA_48  LH LM LL DV DC  Powered_Up_Time  Command/Feature_Name
– == – == – == == == – – – – –  ---------------  --------------------
61 00 08 00 58 00 02 ba 60 f7 90 40 08     12:45:35.109  WRITE FPDMA QUEUED
61 00 08 00 50 00 02 ba 60 f5 90 40 08     12:45:35.109  WRITE FPDMA QUEUED
61 00 08 00 48 00 00 00 00 0b 90 40 08     12:45:35.109  WRITE FPDMA QUEUED
61 00 08 00 40 00 00 00 00 09 90 40 08     12:45:35.109  WRITE FPDMA QUEUED
60 05 58 00 a0 00 00 f8 97 d1 50 40 08     12:45:35.109  READ FPDMA QUEUED

Error 3 [2] occurred at disk power-on lifetime: 307 hours (12 days + 19 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER – ST COUNT  LBA_48  LH LM LL DV DC
– – – == – == == == – – – – –
40 – 51 00 00 00 00 f8 98 4a 18 40 00  Error: UNC at LBA = 0xf8984a18 = 4170730008

Commands leading to the command that caused the error were:
CR FEATR COUNT  LBA_48  LH LM LL DV DC  Powered_Up_Time  Command/Feature_Name
– == – == – == == == – – – – –  ---------------  --------------------
60 02 a8 00 a8 00 00 f8 98 4e d0 40 08     12:45:30.959  READ FPDMA QUEUED
60 02 a8 00 48 00 00 f8 98 49 78 40 08     12:45:30.955  READ FPDMA QUEUED
60 02 b0 00 38 00 00 f8 98 46 c8 40 08     12:45:30.954  READ FPDMA QUEUED
60 02 a8 00 30 00 00 f8 98 44 20 40 08     12:45:30.953  READ FPDMA QUEUED
60 02 a8 00 28 00 00 f8 98 3e c8 40 08     12:45:30.952  READ FPDMA QUEUED

Error 2 [1] occurred at disk power-on lifetime: 307 hours (12 days + 19 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER – ST COUNT  LBA_48  LH LM LL DV DC
– – – == – == == == – – – – –
40 – 51 00 00 00 00 f8 97 b5 68 40 00  Error: UNC at LBA = 0xf897b568 = 4170691944

Commands leading to the command that caused the error were:
CR FEATR COUNT  LBA_48  LH LM LL DV DC  Powered_Up_Time  Command/Feature_Name
– == – == – == == == – – – – –  ---------------  --------------------
60 01 60 00 d8 00 00 f8 93 0b d0 40 08     12:45:27.377  READ FPDMA QUEUED
60 05 58 00 18 00 00 f8 97 b3 e0 40 08     12:45:27.376  READ FPDMA QUEUED
60 08 00 00 a0 00 00 f8 97 ab e0 40 08     12:45:27.019  READ FPDMA QUEUED
60 02 a8 00 f8 00 00 f8 97 a6 88 40 08     12:45:27.015  READ FPDMA QUEUED
60 05 58 00 98 00 00 f8 97 a1 30 40 08     12:45:27.009  READ FPDMA QUEUED

Error 1 [0] occurred at disk power-on lifetime: 307 hours (12 days + 19 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER – ST COUNT  LBA_48  LH LM LL DV DC
– – – == – == == == – – – – –
40 – 51 00 00 00 00 f8 96 6f a0 40 00  Error: UNC at LBA = 0xf8966fa0 = 4170608544

Commands leading to the command that caused the error were:
CR FEATR COUNT  LBA_48  LH LM LL DV DC  Powered_Up_Time  Command/Feature_Name
– == – == – == == == – – – – –  ---------------  --------------------
60 06 60 00 f8 00 00 f8 96 6c 40 40 08     12:45:17.265  READ FPDMA QUEUED
60 02 a8 00 68 00 00 f8 96 66 e8 40 08     12:45:17.246  READ FPDMA QUEUED
60 05 58 00 e8 00 00 f8 96 5e e0 40 08     12:45:17.231  READ FPDMA QUEUED
60 02 a8 00 60 00 00 f8 96 5c 38 40 08     12:45:17.230  READ FPDMA QUEUED
60 02 a8 00 78 00 00 f8 96 56 e0 40 08     12:45:17.190  READ FPDMA QUEUED

SMART Extended Self-test Log Version: 1 (1 sectors)
Num  Test_Description    Status                  Remaining  LifeTime(hours)  LBA_of_first_error

1  Extended offline    Completed without error       00%       365         -

2  Extended offline    Completed: read failure       70%       348         4173887128

3  Short offline       Completed without error       00%       321         -

4  Extended offline    Completed without error       00%        26         -

5  Extended offline    Aborted by host               90%        14         -

1 of 1 failed self-tests are outdated by newer successful extended offline self-test # 1

SMART Selective self-test log data structure revision number 1
SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
1        0        0  Not_testing
2        0        0  Not_testing
3        0        0  Not_testing
4        0        0  Not_testing
5        0        0  Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

SCT Status Version:                  3
SCT Version (vendor specific):       258 (0x0102)
Device State:                        Active (0)
Current Temperature:                    39 Celsius
Power Cycle Min/Max Temperature:     31/41 Celsius
Lifetime    Min/Max Temperature:     27/42 Celsius
Under/Over Temperature Limit Count:   0/0
Vendor specific:
01 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00
00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00

SCT Temperature History Version:     2
Temperature Sampling Period:         1 minute
Temperature Logging Interval:        1 minute
Min/Max recommended Temperature:      0/65 Celsius
Min/Max Temperature Limit:           -41/85 Celsius
Temperature History Size (Index):    478 (441)

Index    Estimated Time   Temperature Celsius
442    2026-08-26 11:11    38  *******************
…    ..( 33 skipped).    ..  *******************
476    2026-08-26 11:45    38  *******************
477    2026-08-26 11:46    39  ********************
…    ..(423 skipped).    ..  ********************
423    2026-08-26 18:50    39  ********************
424    2026-08-26 18:51    38  *******************
…    ..(  5 skipped).    ..  *******************
430    2026-08-26 18:57    38  *******************
431    2026-08-26 18:58    39  ********************
432    2026-08-26 18:59    39  ********************
433    2026-08-26 19:00    39  ********************
434    2026-08-26 19:01    40  *********************
435    2026-08-26 19:02    40  *********************
436    2026-08-26 19:03    40  *********************
437    2026-08-26 19:04    39  ********************
…    ..(  3 skipped).    ..  ********************
441    2026-08-26 19:08    39  ********************

SCT Error Recovery Control:
Read:     70 (7.0 seconds)
Write:     70 (7.0 seconds)

Device Statistics (GP Log 0x04)
Page  Offset Size        Value Flags Description
0x01  =====  =               =  ===  == General Statistics (rev 3) ==
0x01  0x008  4               5  β€”  Lifetime Power-On Resets
0x01  0x010  4             365  β€”  Power-on Hours
0x01  0x018  6     10031715640  β€”  Logical Sectors Written
0x01  0x020  6        11974068  β€”  Number of Write Commands
0x01  0x028  6     24447220781  β€”  Logical Sectors Read
0x01  0x030  6        35070934  β€”  Number of Read Commands
0x01  0x038  6      1314000000  β€”  Date and Time TimeStamp
0x02  =====  =               =  ===  == Free-Fall Statistics (rev 1) ==
0x02  0x010  4               0  β€”  Overlimit Shock Events
0x03  =====  =               =  ===  == Rotating Media Statistics (rev 1) ==
0x03  0x008  4             337  β€”  Spindle Motor Power-on Hours
0x03  0x010  4             212  β€”  Head Flying Hours
0x03  0x018  4             334  β€”  Head Load Events
0x03  0x020  4               0  β€”  Number of Reallocated Logical Sectors
0x03  0x028  4            1672  β€”  Read Recovery Attempts
0x03  0x030  4               0  β€”  Number of Mechanical Start Failures
0x03  0x038  4               0  β€”  Number of Realloc. Candidate Logical Sectors
0x03  0x040  4               0  β€”  Number of High Priority Unload Events
0x04  =====  =               =  ===  == General Errors Statistics (rev 1) ==
0x04  0x008  4               6  β€”  Number of Reported Uncorrectable Errors
0x04  0x010  4               0  β€”  Resets Between Cmd Acceptance and Completion
0x05  =====  =               =  ===  == Temperature Statistics (rev 1) ==
0x05  0x008  1              39  β€”  Current Temperature
0x05  0x010  1              37  β€”  Average Short Term Temperature
0x05  0x018  1               -  β€”  Average Long Term Temperature
0x05  0x020  1              42  β€”  Highest Temperature
0x05  0x028  1              27  β€”  Lowest Temperature
0x05  0x030  1              39  β€”  Highest Average Short Term Temperature
0x05  0x038  1              31  β€”  Lowest Average Short Term Temperature
0x05  0x040  1               -  β€”  Highest Average Long Term Temperature
0x05  0x048  1               -  β€”  Lowest Average Long Term Temperature
0x05  0x050  4               0  β€”  Time in Over-Temperature
0x05  0x058  1              65  β€”  Specified Maximum Operating Temperature
0x05  0x060  4               0  β€”  Time in Under-Temperature
0x05  0x068  1               0  β€”  Specified Minimum Operating Temperature
0x06  =====  =               =  ===  == Transport Statistics (rev 1) ==
0x06  0x008  4              15  β€”  Number of Hardware Resets
0x06  0x010  4              10  β€”  Number of ASR Events
0x06  0x018  4               0  β€”  Number of Interface CRC Errors
0xff  =====  =               =  ===  == Vendor Specific Statistics (rev 1) ==
0xff  0x008  7               0  β€”  Vendor Specific
0xff  0x010  7               0  β€”  Vendor Specific
0xff  0x018  7               0  β€”  Vendor Specific
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value

Pending Defects log (GP Log 0x0c)
No Defects Logged

SATA Phy Event Counters (GP Log 0x11)
ID      Size     Value  Description
0x0001  2            0  Command failed due to ICRC error
0x0002  2            0  R_ERR response for data FIS
0x0003  2            0  R_ERR response for device-to-host data FIS
0x0004  2            0  R_ERR response for host-to-device data FIS
0x0005  2            0  R_ERR response for non-data FIS
0x0006  2            0  R_ERR response for device-to-host non-data FIS
0x0007  2            0  R_ERR response for host-to-device non-data FIS
0x0008  2            0  Device-to-host non-data FIS retries
0x0009  2            1  Transition from drive PhyRdy to drive PhyNRdy
0x000a  2            2  Device-to-host register FISes sent due to a COMRESET
0x000b  2            0  CRC errors within host-to-device FIS
0x000d  2            0  Non-CRC errors within host-to-device FIS
0x000f  2            0  R_ERR response for host-to-device data FIS, CRC
0x0012  2            0  R_ERR response for host-to-device non-data FIS, CRC
0x8000  4       253838  Vendor specific

Now I plan to move the suspect HDD to another slot and run the long SMART there, as well as SMART for the disk I insert in its slot.

I’ll keep you updated and if there are other ideas on what to check, you’re welcome to suggest

Your drive had 4 (four) Multi-Zone Errors. You had a few SMART tests fail, and pass as well.

I am curious if your NAS has the power to run all your drives at once. I don’t know why it wouldn’t, but I try to not rule out anything unless I have actually ruled it out.

My recommendations:
First, the SMART test is not drive bay or connection specific, the test is completely internal to the drive. Once you start the test, nothing will affect it except for smartclt commands or dropping power to the drive. So, no need to swap drive bays, however it also does not hurt. That is up to you. Okay, I will say that the power connection could be the issue and that could be drive bay hardware specific.

Otherwise:

  1. Run a SMART Long test on the suspect drive, do not run a smart test on any other drive during this period and disconnect the Ethernet cable from the NAS until the SMART test is complete. This will ensure the remaining drives are not active, or doing very little.
  2. If the test passes, do it again several times, if it keeps passing.
  3. After 4 complete passed, we can assume the drive is good.
  4. If the drive fails again and it is near sector 4173887128 (if it starts with 417xxxxxx it is close enough). Then the drive probably has a hardware issue with the disk surface media. If this is the case, you can run the system normally as any failing sectors β€œshould” be mapped out, but they must fail a few times before that happens. Or replace the drive.
  5. If the drive passes step 3, then we need to run a SMART Long test on all the drives at once. This will place a load on the power supply and then see if the SMART tests passed. Repeat 3 more times if it passes.
  6. If the drive(s) fail on step 5, then you are looking at a power supply issue.
  7. If the drive(s) pass step 5, you are back to just running your normal SMART Long tests again. I always suggest once a week for the long test, daily for the short test.

Lastly, keep an eye out for more errors.

Good luck.

1 Like

Thank you, I will do as you suggest. I have already replaced disks (now former sda is sdc) and ran long tests both on sdc and new sda (simultaneously. It was before I read your post) - both ended successfully and no new errors.

Power shouldn’t be an issue, but before the errors started, there was an unplanned shutdown - because the NAS is new, I haven’t set it on its planned space and its turnoff button was accidentally pushed.

Ensure you are tracking the drives by the serial number. sda and sdX are assigned based on which drive is recognized/operationally first, not by data connection location. This is critical to track by serial number.

This actually could have been the cause of your SCRUB errors. I won’t tell you that it positively was, but it makes the most sense. Even if the power off was a few days before. However it should not be the cause of a SMART Long test failure.

Can’t you set the power button function to wait 4 seconds before shutting down, or is it only an Immediate Off?

Hope to see some good/happy information after the testing is completed.