S.M.A.R.T error log has older entries than the drive itself

Hey! I encountered SMART errors when trying to run the long test for my SSD. I started troubleshooting those but I don’t really understand the SMART statistics too well. To me it seems like there isn’t a critical issue here but for some reason the long test fails. Somewhere on the internet I saw that this could be a general issue with Sandisk drives if you haven’t updated the firmware which I haven’t done. So far I’ve only encountered one data issue during the past +6 months.

But the more interesting / concerning thing was the error log. To me it seems like the power on lifetime has been reset at some point and the log contains errors older than the drive itself. This is the part that confused me. For context, I bought the drive from Amazonde at the beginning of 2019 so a bit over 6 years ago. The errors are from ~7 years ago. The overall power on time seems a bit low to me but this disk was in my desktop until 6 months ago. Am I just misinterpreting the log or has Amazon sold me a refurbished SSD as a new one without informing me about it?

sudo smartctl -x /dev/sde
smartctl 7.4 2023-08-01 r5530 [x86_64-linux-6.6.44-production+truenas] (local build)
Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org

=== START OF INFORMATION SECTION ===
Model Family:     Marvell based SanDisk SSDs
Device Model:     SanDisk SSD PLUS 1000GB
Serial Number:    184768449212
LU WWN Device Id: 5 001b44 4a9f70a8d
Firmware Version: UH4400RL
User Capacity:    1,000,207,286,272 bytes [1.00 TB]
Sector Size:      512 bytes logical/physical
Rotation Rate:    Solid State Device
Form Factor:      2.5 inches
TRIM Command:     Available, deterministic
Device is:        In smartctl database 7.3/5528
ATA Version is:   ACS-2 T13/2015-D revision 3
SATA Version is:  SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is:    Wed Jun 25 22:05:11 2025 EEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is:   Unavailable
APM feature is:   Disabled
Rd look-ahead is: Enabled
Write cache is:   Enabled
DSN feature is:   Unavailable
ATA Security is:  Disabled, frozen [SEC2]
Wt Cache Reorder: Unavailable

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x00) Offline data collection activity
                                        was never started.
                                        Auto Offline Data Collection: Disabled.
Self-test execution status:      (   0) The previous self-test routine completed
                                        without error or no self-test has ever
                                        been run.
Total time to complete Offline
data collection:                (  120) seconds.
Offline data collection
capabilities:                    (0x15) SMART execute Offline immediate.
                                        No Auto Offline data collection support.
                                        Abort Offline collection upon new
                                        command.
                                        No Offline surface scan supported.
                                        Self-test supported.
                                        No Conveyance Self-test supported.
                                        No Selective Self-test supported.
SMART capabilities:            (0x0003) Saves SMART data before entering
                                        power-saving mode.
                                        Supports SMART auto save timer.
Error logging capability:        (0x01) Error logging supported.
                                        General Purpose Logging supported.
Short self-test routine
recommended polling time:        (   2) minutes.
Extended self-test routine
recommended polling time:        ( 255) minutes.

SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAGS    VALUE WORST THRESH FAIL RAW_VALUE
  5 Reallocated_Sector_Ct   -O--CK   100   100   000    -    0
  9 Power_On_Hours          -O--CK   100   100   000    -    7441
 12 Power_Cycle_Count       -O--CK   100   100   000    -    1437
165 Total_Write/Erase_Count -O--CK   100   100   000    -    1557
166 Min_W/E_Cycle           -O--CK   100   100   ---    -    10
167 Min_Bad_Block/Die       -O--CK   100   100   ---    -    0
168 Maximum_Erase_Cycle     -O--CK   100   100   ---    -    23
169 Total_Bad_Block         -O--CK   100   100   ---    -    542
170 Unknown_Marvell_Attr    -O--CK   100   100   ---    -    0
171 Program_Fail_Count      -O--CK   100   100   000    -    0
172 Erase_Fail_Count        -O--CK   100   100   000    -    0
173 Avg_Write/Erase_Count   -O--CK   100   100   000    -    10
174 Unexpect_Power_Loss_Ct  -O--CK   100   100   000    -    35
184 End-to-End_Error        -O--CK   100   100   ---    -    0
187 Reported_Uncorrect      -O--CK   100   100   000    -    9
188 Command_Timeout         -O--CK   100   100   ---    -    0
194 Temperature_Celsius     -O---K   065   078   000    -    35 (Min/Max 14/78)
199 SATA_CRC_Error          -O--CK   100   100   ---    -    0
230 Perc_Write/Erase_Count  -O--CK   100   100   000    -    1068 512 1068
232 Perc_Avail_Resrvd_Space PO--CK   100   100   005    -    100
233 Total_NAND_Writes_GiB   -O--CK   100   100   ---    -    10471
234 Perc_Write/Erase_Ct_BC  -O--CK   100   100   000    -    24342
241 Total_Writes_GiB        ----CK   100   100   000    -    9874
242 Total_Reads_GiB         ----CK   100   100   000    -    8922
244 Thermal_Throttle        -O--CK   000   100   ---    -    0
                            ||||||_ K auto-keep
                            |||||__ C event count
                            ||||___ R error rate
                            |||____ S speed/performance
                            ||_____ O updated online
                            |______ P prefailure warning

General Purpose Log Directory Version 1
SMART           Log Directory Version 1 [multi-sector log support]
Address    Access  R/W   Size  Description
0x00       GPL,SL  R/O      1  Log Directory
0x01           SL  R/O      1  Summary SMART error log
0x02           SL  R/O      1  Comprehensive SMART error log
0x03       GPL     R/O     16  Ext. Comprehensive SMART error log
0x04       GPL,SL  R/O      8  Device Statistics log
0x06           SL  R/O      1  SMART self-test log
0x07       GPL     R/O      1  Extended self-test log
0x10       GPL     R/O      1  NCQ Command Error log
0x11       GPL     R/O      1  SATA Phy Event Counters log
0x30       GPL,SL  R/O      9  IDENTIFY DEVICE data log
0x80-0x9f  GPL,SL  R/W     16  Host vendor specific log
0xa1       GPL,SL  VS       1  Device vendor specific log
0xa2       GPL,SL  VS       2  Device vendor specific log
0xa3-0xa4  GPL,SL  VS       1  Device vendor specific log
0xa7       GPL,SL  VS       1  Device vendor specific log
0xa9       GPL,SL  VS       3  Device vendor specific log

SMART Extended Comprehensive Error Log Version: 1 (16 sectors)
Device Error Count: 12
        CR     = Command Register
        FEATR  = Features Register
        COUNT  = Count (was: Sector Count) Register
        LBA_48 = Upper bytes of LBA High/Mid/Low Registers ]  ATA-8
        LH     = LBA High (was: Cylinder High) Register    ]   LBA
        LM     = LBA Mid (was: Cylinder Low) Register      ] Register
        LL     = LBA Low (was: Sector Number) Register     ]
        DV     = Device (was: Device/Head) Register
        DC     = Device Control Register
        ER     = Error register
        ST     = Status register
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 12 [1] occurred at disk power-on lifetime: 7420 hours (309 days + 4 hours)
  When the command that caused the error occurred, the device was doing SMART Offline or Self-test.

  After command completion occurred, registers were:
  ER -- ST COUNT  LBA_48  LH LM LL DV DC
  -- -- -- == -- == == == -- -- -- -- --
  40 -- 51 00 00 00 00 00 00 08 00 a0 00

  Commands leading to the command that caused the error were:
  CR FEATR COUNT  LBA_48  LH LM LL DV DC  Powered_Up_Time  Command/Feature_Name
  -- == -- == -- == == == -- -- -- -- --  ---------------  --------------------
  ea 00 00 00 00 00 00 00 00 00 00 a0 00 13d+02:23:05.801  FLUSH CACHE EXT
  2f 00 00 00 01 00 00 00 00 08 30 a0 00  8d+17:33:56.522  READ LOG EXT
  ea 00 00 00 00 00 00 00 00 00 00 a0 00  8d+17:33:56.021  FLUSH CACHE EXT
  2f 00 00 00 01 00 00 00 00 08 30 a0 00  8d+06:19:57.336  READ LOG EXT
  ea 00 00 00 00 00 00 00 00 00 00 a0 00  8d+06:19:56.991  FLUSH CACHE EXT

Error 11 [0] occurred at disk power-on lifetime: 7316 hours (304 days + 20 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER -- ST COUNT  LBA_48  LH LM LL DV DC
  -- -- -- == -- == == == -- -- -- -- --
  40 -- 51 00 04 00 00 00 00 08 04 a0 00  Error: UNC

  Commands leading to the command that caused the error were:
  CR FEATR COUNT  LBA_48  LH LM LL DV DC  Powered_Up_Time  Command/Feature_Name
  -- == -- == -- == == == -- -- -- -- --  ---------------  --------------------
  2f 00 00 00 01 00 00 00 00 08 30 a0 00  8d+17:33:56.522  READ LOG EXT
  ea 00 00 00 00 00 00 00 00 00 00 a0 00  8d+17:33:56.021  FLUSH CACHE EXT
  2f 00 00 00 01 00 00 00 00 08 30 a0 00  8d+06:19:57.336  READ LOG EXT
  ea 00 00 00 00 00 00 00 00 00 00 a0 00  8d+06:19:56.991  FLUSH CACHE EXT
  ea 00 00 00 00 00 00 00 00 00 00 a0 00  3d+10:03:10.808  FLUSH CACHE EXT

Warning! SMART Extended Comprehensive Error Log Structure error: invalid SMART checksum.
Error 10 [63] occurred at disk power-on lifetime: 61166 hours (2548 days + 14 hours)
  When the command that caused the error occurred, the device was in an unknown state.

  After command completion occurred, registers were:
  ER -- ST COUNT  LBA_48  LH LM LL DV DC
  -- -- -- == -- == == == -- -- -- -- --
  00 -- 00 00 00 00 00 00 00 00 00 00 00

  Commands leading to the command that caused the error were:
  CR FEATR COUNT  LBA_48  LH LM LL DV DC  Powered_Up_Time  Command/Feature_Name
  -- == -- == -- == == == -- -- -- -- --  ---------------  --------------------
  00 00 00 00 00 00 00 00 00 00 00 00 45 16d+13:40:55.765  NOP [Abort queued commands]
  00 00 00 00 00 00 00 00 00 00 00 00 44 13d+06:08:44.612  NOP [Abort queued commands]
  00 00 00 00 00 00 00 00 00 00 00 00 43  9d+22:36:33.459  NOP [Abort queued commands]
  00 00 00 00 00 00 00 00 00 00 00 00 42  6d+15:04:22.306  NOP [Abort queued commands]
  00 00 00 00 00 00 00 00 00 00 00 00 41  3d+07:32:11.153  NOP [Abort queued commands]

Error 9 [62] occurred at disk power-on lifetime: 61166 hours (2548 days + 14 hours)
  When the command that caused the error occurred, the device was in an unknown state.

  After command completion occurred, registers were:
  ER -- ST COUNT  LBA_48  LH LM LL DV DC
  -- -- -- == -- == == == -- -- -- -- --
  00 -- 00 00 00 00 00 00 00 00 00 00 00

  Commands leading to the command that caused the error were:
  CR FEATR COUNT  LBA_48  LH LM LL DV DC  Powered_Up_Time  Command/Feature_Name
  -- == -- == -- == == == -- -- -- -- --  ---------------  --------------------
  00 00 00 00 00 00 00 00 00 00 00 00 35 16d+13:40:55.765  NOP [Abort queued commands]
  00 00 00 00 00 00 00 00 00 00 00 00 34 13d+06:08:44.612  NOP [Abort queued commands]
  00 00 00 00 00 00 00 00 00 00 00 00 33  9d+22:36:33.459  NOP [Abort queued commands]
  00 00 00 00 00 00 00 00 00 00 00 00 32  6d+15:04:22.306  NOP [Abort queued commands]
  00 00 00 00 00 00 00 00 00 00 00 00 31  3d+07:32:11.153  NOP [Abort queued commands]

Error 8 [61] occurred at disk power-on lifetime: 61166 hours (2548 days + 14 hours)
  When the command that caused the error occurred, the device was in an unknown state.

  After command completion occurred, registers were:
  ER -- ST COUNT  LBA_48  LH LM LL DV DC
  -- -- -- == -- == == == -- -- -- -- --
  00 -- 00 00 00 00 00 00 00 00 00 00 00

  Commands leading to the command that caused the error were:
  CR FEATR COUNT  LBA_48  LH LM LL DV DC  Powered_Up_Time  Command/Feature_Name
  -- == -- == -- == == == -- -- -- -- --  ---------------  --------------------
  00 00 00 00 00 00 00 00 00 00 00 00 25 16d+13:40:55.765  NOP [Abort queued commands]
  00 00 00 00 00 00 00 00 00 00 00 00 24 13d+06:08:44.612  NOP [Abort queued commands]
  00 00 00 00 00 00 00 00 00 00 00 00 23  9d+22:36:33.459  NOP [Abort queued commands]
  00 00 00 00 00 00 00 00 00 00 00 00 22  6d+15:04:22.306  NOP [Abort queued commands]
  00 00 00 00 00 00 00 00 00 00 00 00 21  3d+07:32:11.153  NOP [Abort queued commands]

Error 7 [60] occurred at disk power-on lifetime: 43981 hours (1832 days + 13 hours)
  When the command that caused the error occurred, the device was in an unknown state.

  After command completion occurred, registers were:
  ER -- ST COUNT  LBA_48  LH LM LL DV DC
  -- -- -- == -- == == == -- -- -- -- --
  00 -- 00 00 00 00 00 00 00 00 00 00 00

  Commands leading to the command that caused the error were:
  CR FEATR COUNT  LBA_48  LH LM LL DV DC  Powered_Up_Time  Command/Feature_Name
  -- == -- == -- == == == -- -- -- -- --  ---------------  --------------------
  00 00 00 00 00 00 00 00 00 00 00 00 15 16d+13:40:55.765  NOP [Abort queued commands]
  00 00 00 00 00 00 00 00 00 00 00 00 14 13d+06:08:44.612  NOP [Abort queued commands]
  00 00 00 00 00 00 00 00 00 00 00 00 13  9d+22:36:33.459  NOP [Abort queued commands]
  00 00 00 00 00 00 00 00 00 00 00 00 12  6d+15:04:22.306  NOP [Abort queued commands]
  00 00 00 00 00 00 00 00 00 00 00 00 11  3d+07:32:11.153  NOP [Abort queued commands]

Warning! SMART Extended Comprehensive Error Log Structure error: invalid SMART checksum.
Error 6 [59] occurred at disk power-on lifetime: 61166 hours (2548 days + 14 hours)
  When the command that caused the error occurred, the device was in an unknown state.

  After command completion occurred, registers were:
  ER -- ST COUNT  LBA_48  LH LM LL DV DC
  -- -- -- == -- == == == -- -- -- -- --
  00 -- 00 00 00 00 00 00 00 00 00 00 00

  Commands leading to the command that caused the error were:
  CR FEATR COUNT  LBA_48  LH LM LL DV DC  Powered_Up_Time  Command/Feature_Name
  -- == -- == -- == == == -- -- -- -- --  ---------------  --------------------
  00 00 00 00 00 00 00 00 00 00 00 00 45 16d+13:40:55.765  NOP [Abort queued commands]
  00 00 00 00 00 00 00 00 00 00 00 00 44 13d+06:08:44.612  NOP [Abort queued commands]
  00 00 00 00 00 00 00 00 00 00 00 00 43  9d+22:36:33.459  NOP [Abort queued commands]
  00 00 00 00 00 00 00 00 00 00 00 00 42  6d+15:04:22.306  NOP [Abort queued commands]
  00 00 00 00 00 00 00 00 00 00 00 00 41  3d+07:32:11.153  NOP [Abort queued commands]

Error 5 [58] occurred at disk power-on lifetime: 61166 hours (2548 days + 14 hours)
  When the command that caused the error occurred, the device was in an unknown state.

  After command completion occurred, registers were:
  ER -- ST COUNT  LBA_48  LH LM LL DV DC
  -- -- -- == -- == == == -- -- -- -- --
  00 -- 00 00 00 00 00 00 00 00 00 00 00

  Commands leading to the command that caused the error were:
  CR FEATR COUNT  LBA_48  LH LM LL DV DC  Powered_Up_Time  Command/Feature_Name
  -- == -- == -- == == == -- -- -- -- --  ---------------  --------------------
  00 00 00 00 00 00 00 00 00 00 00 00 35 16d+13:40:55.765  NOP [Abort queued commands]
  00 00 00 00 00 00 00 00 00 00 00 00 34 13d+06:08:44.612  NOP [Abort queued commands]
  00 00 00 00 00 00 00 00 00 00 00 00 33  9d+22:36:33.459  NOP [Abort queued commands]
  00 00 00 00 00 00 00 00 00 00 00 00 32  6d+15:04:22.306  NOP [Abort queued commands]
  00 00 00 00 00 00 00 00 00 00 00 00 31  3d+07:32:11.153  NOP [Abort queued commands]

SMART Extended Self-test Log Version: 1 (1 sectors)
Num  Test_Description    Status                  Remaining  LifeTime(hours)  LBA_of_first_error
# 1  Short offline       Completed without error       00%      7424         -
# 2  Extended offline    Fatal or unknown error        60%      7420         0
# 3  Extended offline    Self-test routine in progress 70%      7419         -
# 4  Extended offline    Self-test routine in progress 70%      7419         -
# 5  Extended offline    Self-test routine in progress 90%      7417         -
# 6  Extended offline    Self-test routine in progress 90%      7417         -
# 7  Extended offline    Self-test routine in progress 90%      7417         -
# 8  Short offline       Completed without error       00%      7352         -
# 9  Short offline       Completed without error       00%      7328         -
#10  Short offline       Completed without error       00%      7304         -
#11  Short offline       Completed without error       00%      7280         -
#12  Short offline       Completed without error       00%      7256         -
#13  Short offline       Completed without error       00%      7232         -
#14  Short offline       Completed without error       00%      7208         -
#15  Extended offline    Fatal or unknown error        60%      7188         0
#16  Extended offline    Self-test routine in progress 70%      7187         -
#17  Extended offline    Self-test routine in progress 70%      7187         -
#18  Short offline       Completed without error       00%      7184         -
#19  Short offline       Completed without error       00%      7160         -

Selective Self-tests/Logging not supported

SCT Commands not supported

Device Statistics (GP Log 0x04)
Page  Offset Size        Value Flags Description
0x01  =====  =               =  ===  == General Statistics (rev 1) ==
0x01  0x008  4            1437  ---  Lifetime Power-On Resets
0x01  0x010  4            7441  ---  Power-on Hours
0x01  0x018  6     20708842850  ---  Logical Sectors Written
0x01  0x028  6     18711685093  ---  Logical Sectors Read
0x01  0x038  6            7443  ---  Date and Time TimeStamp
0x05  =====  =               =  ===  == Temperature Statistics (rev 1) ==
0x05  0x008  1              35  ---  Current Temperature
0x05  0x010  1              35  ---  Average Short Term Temperature
0x05  0x018  1               -  ---  Average Long Term Temperature
0x05  0x020  1              76  ---  Highest Temperature
0x05  0x028  1              29  ---  Lowest Temperature
0x05  0x030  1              42  ---  Highest Average Short Term Temperature
0x05  0x038  1              42  ---  Lowest Average Short Term Temperature
0x05  0x040  1              36  ---  Highest Average Long Term Temperature
0x05  0x048  1              36  ---  Lowest Average Long Term Temperature
0x05  0x050  4               0  ---  Time in Over-Temperature
0x05  0x058  1              95  ---  Specified Maximum Operating Temperature
0x05  0x060  4               0  ---  Time in Under-Temperature
0x05  0x068  1               0  ---  Specified Minimum Operating Temperature
0x07  =====  =               =  ===  == Solid State Device Statistics (rev 1) ==
0x07  0x008  1               2  N--  Percentage Used Endurance Indicator
                                |||_ C monitored condition met
                                ||__ D supports DSN
                                |___ N normalized value

Pending Defects log (GP Log 0x0c) not supported

SATA Phy Event Counters (GP Log 0x11)
ID      Size     Value  Description
0x0003  2            0  R_ERR response for device-to-host data FIS
0x0004  2            0  R_ERR response for host-to-device data FIS
0x0006  2            0  R_ERR response for device-to-host non-data FIS
0x0007  2            0  R_ERR response for host-to-device non-data FIS
0x0009  2            2  Transition from drive PhyRdy to drive PhyNRdy
0x000a  2            3  Device-to-host register FISes sent due to a COMRESET
0x000f  2            0  R_ERR response for host-to-device data FIS, CRC
0x0012  2            0  R_ERR response for host-to-device non-data FIS, CRC
0x0001  2            0  Command failed due to ICRC error

in my really little experience, i have seen a couple of “smart power on hours” mistmatch… so this cases shouldn’t be so rare. My 2 NVME, for example, have stopped to increase this attribute despite they are on 24/7 :smile: and this puzzled me a lot.

In your specific case, the 61166 hours logged by the error (if i’m not wrong) seems to fit with the disk age, like a bug in the firmware that started count from another point despite the other attribute (or worst, corruption, Warning! SMART Extended Comprehensive Error Log Structure error: invalid SMART checksum.)
Also the wear level/data write seem pretty aligned with the use you describe.
In your place, instead of the “amazon scam”, i would be more worried about

  • this disk can’t perform a single long test
  • 169 Total_Bad_Block -O--CK 100 100 --- - 542 is kinda bad, worst if they are still growing
  • 194 Temperature_Celsius -O---K 065 078 000 - 35 (Min/Max 14/78) 78 like this disk have been fried in the past :smile:

Should you update the firmware? Maybe some problems will disappear, maybe you’ll end up with a paperweight. In both case, in this situation, this isn’t a disk i would use in my systems

The Power On Hours are likely recycling once they hit a specific value, typically 65,535 and then next hour is 1. Some drives can handle it, or they just fail well before that number comes up.

As for the other concern, were you sold a used drive? I can’t answer that. You have a few unverified variables:

  1. “purchased about 6 years ago” is not denying it could have been 7 or 8 years ago. Time can really pass fast in the computer parts area. I always think I purchased something on some specific period of time, just to look at my actual purchase date and tell myself, that can’t be true. Memory can mess with you. But if you have the purchase date, then you would know if the drive was previously used, refurbished.
  2. While the drive was in a desktop system, was the power on for the vast majority of the time? Since I do not know the configuration, it comes down to if power was applied to the drive, not if the computer was operating. If the drive were in an external enclosure would be a great example.

Your drive looks like it had a SMART Long/Extended test failure, maybe.
What do you need to do? Confirm the failure.

Your test is not clear that it failed, it could have been caused by a few different things so run the Long test to confirm.

Run the command from the shell smartctl -t long /dev/sde then wait at least 4.5 hours for the test to complete. Next run smartctl -a /dev/sde and look at the bottom of the output for the extended results. If it is anything other than a pass, it is a failure. Feel free to post that output if you would like a second opinion.

Thanks a lot for the replies @oxyde @joeschmuck!

I agree that this is concerning.

I read from multiple sources that this should be normal and even new drives have these bad blocks. Is my interpretation wrong?

Honestly I have no clue how this could have happened but maybe this drive heats up considerably when it’s under load.

  1. The exact date of purchase was 3.1.2019. Then there is also the shipping delay.
  2. The desktop system the drive was used in was powered off most of the time (no sleep was used).

So with this information you’d say that the drive in fact was refurbished and not new?

I started the test again, I’ll post the results later.

I have to admit, i have to correct a bit myself, I have interpreted the data as if the disk was smaller :upside_down_face: with a 1tb one, i think you should be fine. Or, at least, until this value not start growing fast and the Reallocated_Sector_Ct not increase.

Despite this, i’m not convinced you got “scammed”, but let’s see other tests, if something different come out

Things I read on the internet are not always correct. People make guesses. I will tell you factual data and if I do not have factual data, I will use words like “I believe” or “should” for example. But I base that data on my experience. And as always, form your own opinions based on what you read. But if you can get data directly from the manufacturer, that is the best place to get it. With that said, use your best judgement.

I have never seen a drive ship with bad sectors reported from a new drive. Bad sectors are mapped out of view at the factory, and “should” be for a refurbished drive from the manufacturer as well.

A refurbished drive from an independent seller could have tested the crap out of the drive and sold it as refurbished. That I could believe.

The fact that the “VALUE” is still at 100 is a good thing. Once it starts to drop, look for another drive.

Your drive is definitely older than your date of purchase, even if you left the drive powered on all the time, 52,560 hours is 6 years. You still have a minimum of 1 year of power on time beyond that just to get to 61,000 hours.

It is my opinion your drive was used before. I cannot say it was refurbished.

But the bottom dollar as they say, if you cannot pass a SMART Long test, replace the drive, do not wait for it to fail further.

Thanks a lot for sharing your thoughts! I ran the test again but like previously, the test failed without a proper smart error:

sudo smartctl -a /dev/sde
smartctl 7.4 2023-08-01 r5530 [x86_64-linux-6.6.44-production+truenas] (local build)
Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org

=== START OF INFORMATION SECTION ===
Model Family:     Marvell based SanDisk SSDs
Device Model:     SanDisk SSD PLUS 1000GB
Serial Number:    184768449212
LU WWN Device Id: 5 001b44 4a9f70a8d
Firmware Version: UH4400RL
User Capacity:    1,000,207,286,272 bytes [1.00 TB]
Sector Size:      512 bytes logical/physical
Rotation Rate:    Solid State Device
Form Factor:      2.5 inches
TRIM Command:     Available, deterministic
Device is:        In smartctl database 7.3/5770
ATA Version is:   ACS-2 T13/2015-D revision 3
SATA Version is:  SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is:    Fri Jul  4 20:14:07 2025 EEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x00) Offline data collection activity
                                        was never started.
                                        Auto Offline Data Collection: Disabled.
Self-test execution status:      (   0) The previous self-test routine completed
                                        without error or no self-test has ever
                                        been run.
Total time to complete Offline
data collection:                (  120) seconds.
Offline data collection
capabilities:                    (0x15) SMART execute Offline immediate.
                                        No Auto Offline data collection support.
                                        Abort Offline collection upon new
                                        command.
                                        No Offline surface scan supported.
                                        Self-test supported.
                                        No Conveyance Self-test supported.
                                        No Selective Self-test supported.
SMART capabilities:            (0x0003) Saves SMART data before entering
                                        power-saving mode.
                                        Supports SMART auto save timer.
Error logging capability:        (0x01) Error logging supported.
                                        General Purpose Logging supported.
Short self-test routine
recommended polling time:        (   2) minutes.
Extended self-test routine
recommended polling time:        ( 255) minutes.

SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  5 Reallocated_Sector_Ct   0x0032   100   100   000    Old_age   Always       -       0
  9 Power_On_Hours          0x0032   100   100   000    Old_age   Always       -       7655
 12 Power_Cycle_Count       0x0032   100   100   000    Old_age   Always       -       1437
165 Total_Write/Erase_Count 0x0032   100   100   000    Old_age   Always       -       1578
166 Min_W/E_Cycle           0x0032   100   100   ---    Old_age   Always       -       10
167 Min_Bad_Block/Die       0x0032   100   100   ---    Old_age   Always       -       0
168 Maximum_Erase_Cycle     0x0032   100   100   ---    Old_age   Always       -       23
169 Total_Bad_Block         0x0032   100   100   ---    Old_age   Always       -       542
170 Unknown_Marvell_Attr    0x0032   100   100   ---    Old_age   Always       -       0
171 Program_Fail_Count      0x0032   100   100   000    Old_age   Always       -       0
172 Erase_Fail_Count        0x0032   100   100   000    Old_age   Always       -       0
173 Avg_Write/Erase_Count   0x0032   100   100   000    Old_age   Always       -       10
174 Unexpect_Power_Loss_Ct  0x0032   100   100   000    Old_age   Always       -       35
184 End-to-End_Error        0x0032   100   100   ---    Old_age   Always       -       0
187 Reported_Uncorrect      0x0032   100   100   000    Old_age   Always       -       9
188 Command_Timeout         0x0032   100   100   ---    Old_age   Always       -       0
194 Temperature_Celsius     0x0022   064   078   000    Old_age   Always       -       36 (Min/Max 14/78)
199 SATA_CRC_Error          0x0032   100   100   ---    Old_age   Always       -       0
230 Perc_Write/Erase_Count  0x0032   100   100   000    Old_age   Always       -       1074 512 1074
232 Perc_Avail_Resrvd_Space 0x0033   100   100   005    Pre-fail  Always       -       100
233 Total_NAND_Writes_GiB   0x0032   100   100   ---    Old_age   Always       -       10583
234 Perc_Write/Erase_Ct_BC  0x0032   100   100   000    Old_age   Always       -       24661
241 Total_Writes_GiB        0x0030   100   100   000    Old_age   Offline      -       9965
242 Total_Reads_GiB         0x0030   100   100   000    Old_age   Offline      -       8929
244 Thermal_Throttle        0x0032   000   100   ---    Old_age   Always       -       0

SMART Error Log Version: 1
No Errors Logged

SMART Self-test log structure revision number 1
Num  Test_Description    Status                  Remaining  LifeTime(hours)  LBA_of_first_error
# 1  Short offline       Completed without error       00%      7640         -
# 2  Extended offline    Fatal or unknown error        60%      7631         0
# 3  Extended offline    Self-test routine in progress 80%      7629         -
# 4  Short offline       Completed without error       00%      7616         -
# 5  Short offline       Self-test routine in progress 40%      7616         -
# 6  Short offline       Completed without error       00%      7592         -
# 7  Short offline       Self-test routine in progress 40%      7592         -
# 8  Short offline       Completed without error       00%      7568         -
# 9  Short offline       Self-test routine in progress 40%      7568         -
#10  Short offline       Completed without error       00%      7544         -
#11  Short offline       Completed without error       00%      7520         -
#12  Short offline       Completed without error       00%      7496         -
#13  Short offline       Completed without error       00%      7472         -
#14  Short offline       Completed without error       00%      7448         -
#15  Short offline       Completed without error       00%      7424         -
#16  Extended offline    Fatal or unknown error        60%      7420         0
#17  Extended offline    Self-test routine in progress 70%      7419         -
#18  Extended offline    Self-test routine in progress 70%      7419         -
#19  Extended offline    Self-test routine in progress 90%      7417         -
#20  Extended offline    Self-test routine in progress 90%      7417         -
#21  Extended offline    Self-test routine in progress 90%      7417         -

Selective Self-tests/Logging not supported

The above only provides legacy SMART information - try 'smartctl -x' for more

I’ll probably contact Amazon about the drive and I’ll also try the firmware update. After I’ve exhausted my options I’ll replace the drive. Thanks for all the help with this!