Hello,
since a few weeks i get smart errors on my boot ssd.
The ssd is a few years old but was not used much. The TBW of it are very low.
Do i have to replace it but can it be fixed?
root@FreeNAS:~# 2024 May 24 07:36:18 FreeNAS Device: /dev/sdc [SAT], FAILED SMART self-check. BACK UP DATA NOW!
2024 May 24 07:36:18 FreeNAS Device: /dev/sdc [SAT], Failed SMART usage Attribute: 173 Wear_Leveling_Count.
2024 May 24 07:36:18 FreeNAS Device: /dev/sdc [SAT], Failed SMART usage Attribute: 233 Media_Wearout_Indicator.
root@FreeNAS:~# smartctl -a /dev/sdc
smartctl 7.4 2023-08-01 r5530 [x86_64-linux-6.6.20-production+truenas] (local build)
Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: SAMSUNG MZ7TY256HDHP-000L7
Serial Number: S307NB0H813108
LU WWN Device Id: 5 002538 d00000000
Firmware Version: MAT05L6Q
User Capacity: 256,060,514,304 bytes [256 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
TRIM Command: Available
Device is: In smartctl database 7.3/5528
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Fri May 24 07:38:33 2024 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: FAILED!
Drive failure expected in less than 24 hours. SAVE ALL DATA.
See vendor-specific Attribute list for failed Attributes.
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 73) The previous self-test completed having
a test element that failed and the test
element that failed is not known.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 85) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
5 Reallocated_Sector_Ct 0x0033 100 100 010 Pre-fail Always - 0
9 Power_On_Hours 0x0032 094 094 000 Old_age Always - 26151
12 Power_Cycle_Count 0x0032 094 094 000 Old_age Always - 5773
170 Unused_Rsvd_Blk_Ct_Chip 0x0032 100 100 010 Old_age Always - 0
171 Program_Fail_Count_Chip 0x0032 100 100 010 Old_age Always - 0
172 Erase_Fail_Count_Chip 0x0032 100 100 010 Old_age Always - 0
173 Wear_Leveling_Count 0x0033 001 001 005 Pre-fail Always FAILING_NOW 854
174 Unexpect_Power_Loss_Ct 0x0032 099 099 000 Old_age Always - 85
178 Used_Rsvd_Blk_Cnt_Chip 0x0013 100 100 010 Pre-fail Always - 0
180 Unused_Rsvd_Blk_Cnt_Tot 0x0013 100 100 010 Pre-fail Always - 1836
184 End-to-End_Error 0x0033 100 100 097 Pre-fail Always - 0
187 Uncorrectable_Error_Cnt 0x0032 100 100 000 Old_age Always - 0
194 Temperature_Celsius 0x0032 059 038 000 Old_age Always - 41 (Min/Max 0/62)
199 CRC_Error_Count 0x003e 100 100 000 Old_age Always - 0
233 Media_Wearout_Indicator 0x0013 001 001 001 Pre-fail Always FAILING_NOW 258956977441341
241 Total_LBAs_Written 0x0032 099 099 000 Old_age Always - 35622
242 Total_LBAs_Read 0x0032 099 099 000 Old_age Always - 24960
249 NAND_Writes_1GiB 0x0032 099 099 000 Old_age Always - 218800
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed: unknown failure 90% 26055 0
# 2 Short offline Completed: unknown failure 90% 26024 0
# 3 Short offline Completed: unknown failure 90% 25945 0
# 4 Short offline Completed: unknown failure 90% 25856 0
# 5 Short offline Completed: unknown failure 90% 25729 0
# 6 Short offline Completed: unknown failure 90% 25688 0
# 7 Short offline Completed: unknown failure 90% 25647 0
# 8 Short offline Completed: unknown failure 90% 25520 0
# 9 Short offline Completed: unknown failure 90% 25520 0
#10 Short offline Completed: unknown failure 90% 25352 0
#11 Short offline Completed: unknown failure 90% 25227 0
#12 Short offline Completed: unknown failure 90% 25184 0
#13 Short offline Completed: unknown failure 90% 25184 0
#14 Short offline Completed: unknown failure 90% 25016 0
#15 Short offline Completed: unknown failure 90% 25016 0
#16 Short offline Completed: unknown failure 90% 24849 0
#17 Extended offline Completed: unknown failure 90% 24849 0
#18 Extended offline Completed: unknown failure 90% 24724 0
#19 Short offline Completed without error 00% 24681 -
#20 Short offline Completed without error 00% 24513 -
#21 Short offline Completed without error 00% 24345 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
The above only provides legacy SMART information - try 'smartctl -x' for more
Thank you