I’m using scale 25.04.0 with an 8width 2xRAIDZ2. All of 16 disks are 16TB HC550, not same batch.
Today I recieve a mail that “Device: /dev/sda [SAT], ATA error count increased from 0 to 1.” Using the “smartctl -a /dev/sda” I get the log below.
smartctl 7.4 2023-08-01 r5530 [x86_64-linux-6.12.15-production+truenas] (local build)
=== START OF INFORMATION SECTION ===
Model Family: Western Digital Ultrastar DC HC550
Device Model: WDC WUH721816ALE6L4
Serial Number: 2CJRSZWN
LU WWN Device Id: 5 000cca 2a1e68940
Firmware Version: PCGNW232
User Capacity: 16,000,900,661,248 bytes [16.0 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: 7200 rpm
Form Factor: 3.5 inches
Device is: In smartctl database 7.3/5706
ATA Version is: ACS-4 published, ANSI INCITS 529-2018
SATA Version is: SATA 3.3, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Tue Jul 8 08:01:03 2025 CST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 101) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: (1716) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 001 Pre-fail Always - 0
2 Throughput_Performance 0x0005 136 136 054 Pre-fail Offline - 96
3 Spin_Up_Time 0x0007 083 083 001 Pre-fail Always - 347 (Average 345)
4 Start_Stop_Count 0x0012 100 100 000 Old_age Always - 53
5 Reallocated_Sector_Ct 0x0033 100 100 001 Pre-fail Always - 0
7 Seek_Error_Rate 0x000b 100 100 001 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 140 140 020 Pre-fail Offline - 15
9 Power_On_Hours 0x0012 095 095 000 Old_age Always - 35589
10 Spin_Retry_Count 0x0013 100 100 001 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 53
22 Helium_Level 0x0023 100 100 025 Pre-fail Always - 100
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 1546
193 Load_Cycle_Count 0x0012 100 100 000 Old_age Always - 1546
194 Temperature_Celsius 0x0002 063 063 000 Old_age Always - 32 (Min/Max 11/42)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x000a 100 100 000 Old_age Always - 1
SMART Error Log Version: 1
ATA Error Count: 1
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It “wraps” after 49.710 days.
Error 1 occurred at disk power-on lifetime: 35579 hours (1482 days + 11 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
84 43 00 00 00 00 00 Error: ICRC, ABRT at LBA = 0x00000000 = 0
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
60 30 00 90 c7 b4 40 00 6d+13:50:01.596 READ FPDMA QUEUED
60 28 08 38 c7 b4 40 00 6d+13:50:01.595 READ FPDMA QUEUED
60 30 00 08 c7 b4 40 00 6d+13:50:01.595 READ FPDMA QUEUED
60 28 08 e0 c6 b4 40 00 6d+13:50:01.594 READ FPDMA QUEUED
60 28 00 b0 c6 b4 40 00 6d+13:50:01.594 READ FPDMA QUEUED
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
1 Short offline Completed without error 00% 35568 -
2 Short offline Completed without error 00% 35545 -
3 Short offline Completed without error 00% 35520 -
4 Short offline Completed without error 00% 35496 -
5 Short offline Completed without error 00% 35472 -
6 Short offline Completed without error 00% 35448 -
7 Short offline Completed without error 00% 35424 -
8 Short offline Completed without error 00% 35401 -
9 Short offline Completed without error 00% 35376 -
#10 Short offline Completed without error 00% 35355 -
#11 Short offline Completed without error 00% 35328 -
#12 Short offline Completed without error 00% 35304 -
#13 Short offline Completed without error 00% 35281 -
#14 Short offline Completed without error 00% 35258 -
#15 Short offline Completed without error 00% 35234 -
#16 Short offline Completed without error 00% 35219 -
#17 Short offline Completed without error 00% 35208 -
#18 Short offline Completed without error 00% 35184 -
#19 Short offline Completed without error 00% 35160 -
#20 Short offline Completed without error 00% 35145 -
#21 Short offline Completed without error 00% 35112 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
The above only provides legacy SMART information - try ‘smartctl -x’ for more
Does the drive need replacing? Do I need to test anything else?
Thank you for the answers.